Fully operational, (Fab-Finder owned) and running 200mm CMOS line. 6-7 levels of Al interconnect. 0.18um to 0.13um tech node. These tools are beautiful- we have all documentation and photographs available. 103 tools moved out between October and December 2009. 250+ tools moving out December to May 2010.
Our prices are very low for tools of this quality- let us show you! Call today!
Our prices are very low for tools of this quality- let us show you! Call today!
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To see configuration details click on the Config link in far right column (if available).
| FF # | Module | Type | Model | Manufacture | Vintage | Serial Number | Config |
| 1 | Ash | Asher | ASPEN2 | Mattson | 19961031 | - | |
| 2 | Ash | Asher | ASPEN2 | Mattson | 20010228 | 789 | |
| 3 | Ash | Asher | ASPEN-2C | Mattson | 20050331 | #55 | |
| 4 | Ash | Asher | GEMINI-ES | Axcelis | 20060831 | GES0053 | |
| 5 | Ash | ILD ASHER | TCA-3822 | TOK | 199408 | T-9405289 | |
| 6 | CMP | CMP | MIRRA-3400(ILD) | AMAT | 20001231 | E30877/P308460 | |
| 7 | CMP | CMP | MIRRA-3400(ILD) | AMAT | 20030930 | MIRRA-SIO | |
| 8 | CMP | CMP | MIRRA-3400(W) | AMAT | 20001231 | P308446/E30876 | |
| 9 | CMP | CMP | MIRRA-3400(W) | AMAT | 20030630 | E-43708/P-L582 | |
| 10 | CMP | Wafer Scubber | AS-2000 | DNS | 20030630 | 59530-5174 | |
| 11 | CMP | CMP | MIRRA-3400(ILD) | AMAT | 20000930 | P305215/E28023 | |
| 12 | CMP | CMP | MIRRA-3400(ILD) | AMAT | 19990731 | E-1027/P-9360 | |
| 13 | CMP | CMP | MIRRA-3400(ILD) | AMAT | 20000430 | P-L632/E-12222 | |
| 14 | CMP | CMP | MIRRA-3400(W) | AMAT | 19991231 | E-9373/P-L493 | |
| 15 | CMP | CMP | MIRRA-3400(W) | AMAT | 20000930 | P302422/E12212 | |
| 17 | CMP | CMP | 6DS-SP | STRASBAUGH | 19970930 | 1181295 | |
| 18 | CMP | CMP | 6DS-SP | STRASBAUGH | 19970930 | 1590596 | |
| 19 | CMP | POLISHER | STRB-6DS | STRASBAUGH | 199806 | 2191097 | |
| 20 | CMP | POLISHER | STRB-6DS(SiO) | STRASBAUGH | 199804 | 2100897 | |
| 21 | Diff | LPCVD | a808SC | TEL | 19990430 | A0000992502 | |
| 22 | Diff | LPCVD | a808SC(ASI) | TEL | 19971130 | A00009755272 | |
| 23 | Diff | LPCVD | a808SC(ASI) | TEL | 20001231 | A00000095263 | Config |
| 24 | Diff | LPCVD | a808SC(DASI) | TEL | 20001231 | A00000095261 | |
| 25 | Diff | LPCVD | a808SC(HTO) | TEL | 20001231 | A000000X5265 | |
| 26 | Diff | LPCVD | a808SCN(SIN) | TEL | 19971130 | A00009755281 | |
| 27 | Diff | Vertical anneal furnace | a808SD | TEL | 19960228 | 95Y5369 | |
| 28 | Diff | Vertical anneal furnace | a808SD | TEL | 19970630 | 9735152 | |
| 29 | Diff | Vertical anneal furnace | a808SD(A-CURE) | TEL | 19970930 | - | |
| 30 | Diff | Vertical anneal furnace | a808SD(HSQ) | TEL | 20040930 | A00009985090 | |
| 31 | Diff | Vertical Diffusion | a808SD(BUOX+SACOX) | TEL | 19980430 | - | |
| 32 | Diff | Vertical Diffusion | a808SD(G-OX) | TEL | 19970930 | - | |
| 33 | Diff | Vertical Diffusion | ALPHA-8SE-Z | TEL | 20061231 | M00000165473 | Config |
| 34 | Diff | Vertical Diffusion | a808SD(RUN+FOX) | TEL | 19970930 | A00003755274 | Config |
| 35 | Diff | Vertical Diffusion | a808SD(I-OX) | TEL | 19970930 | - | |
| 36 | Diff | Vertical Diffusion | a8SE-ZA | TEL | 20030731 | M00000135159 | Config |
| 37 | Diff | Vertical Diffusion | a805D | TEL | 19950630 | 300009535044 | Config |
| 38 | Diff | Vertical Diffusion | a808SD(M1C-AN) | TEL | 19980430 | - | |
| 39 | Diff | Vertical Diffusion | a808SD(NST-AN) | TEL | 19970930 | A00003755273 | Config |
| 40 | Diff | Vertical Diffusion | a808SD(SCR-OX) | TEL | 19970930 | - | |
| 41 | Diff | Vertical Diffusion | a-808SD | TEL | 199710 | A00009765381 | |
| 42 | Diff | Vertical Diffusion | a-808SD | TEL | 199710 | A00009765380 | |
| 43 | Diff | SOS-CURE-FURNNACE | a-808SD | TEL | 199806 | A000097X5544 | |
| 44 | Diff | VERTICAL CVD FURNACE | a-808SC | TEL | 199505 | A00009510004 | |
| 45 | Diff | VERTICAL CVD FURNACE | a-808SC | TEL | 199408 | A00009430005 | |
| 46 | Diff | VERTICAL DIFF FURNACE | a-808SD | TEL | 199408 | A00009430012 | |
| 48 | Diff | VERTICAL DIFF FURNACE | a-808SD | TEL | 199505 | A00009510002 | |
| 49 | Diff | VERTICAL DIFF FURNACE | a-808SD | TEL | 199509 | A00009540062 | |
| 51 | Diff | VERTICAL DIFF FURNACE | a-808SD(WOX) | TEL | 199705 | A00009660293 | |
| 52 | Etch | Metal Etcher | TCP-9600 | Lam Research | 19950930 | 4241 | |
| 53 | Etch | Metal Etcher | TCP-9600 | Lam Research | 19951130 | 4287 | |
| 54 | Etch | Dry Etching | TE-8500PE | TEL | 19980430 | K85772 | |
| 55 | Etch | Oxide Ething | UN85DI | TEL | 20000430 | U01128 | |
| 57 | Etch | Oxide Ething | UN85DI | TEL | 20000731 | U00973 | |
| 58 | Etch | Oxide Ething | UN85DI | TEL | 20010331 | U01133 | |
| 61 | Etch | Metal Etcher | OZ-5500 | Sumitomo-LAM | 19961130 | MZ075 | |
| 62 | Etch | Metal Etcher | OZ-5500 | Sumitomo-LAM | 19980131 | MZ356 | |
| 63 | Etch | W etch back Dry Etching | TE-8600STRIE | TEL | 19960131 | K86447 | |
| 64 | Etch | Etcher | MAS-8000 | Canon | 19960228 | 81411 | |
| 65 | Etch | Metal Etcher | OZ-3000 | Sumitomo-LAM | 19970930 | PZ466 | |
| 66 | Etch | Metal Etcher | OZ-5500 | Sumitomo-LAM | 19960131 | MZ065 | |
| 67 | Etch | Metal Etcher p | OZ5500 | Sumitomo-LAM | 19950831 | MZ-034 | |
| 68 | Etch | Metal Etcher p | OZ5500 | Sumitomo-LAM | 19960930 | MZ-105 | |
| 69 | Etch | Etcher | UNITYV285DP | TEL | 19971231 | 186 | |
| 70 | Etch | Etcher | CENTURA-MXP | AMAT | 200012 | 29805 | Config |
| 72 | Etch | Metal Etcher | TCP9600SE | Lam Research | 200210 | 42138 | |
| 73 | Etch | Metal Etcher | TCP9600-SE | Lam Research | 200207 | 42137 | |
| 74 | Etch | DRY ETCHER nit | TE-8401 | TEL | 200003 | K84839 | |
| 75 | Etch | DRY ETCHER nit | TE-8401 | TEL | 200004 | K84838 | |
| 76 | Etch | DRY ETCHER nit | TE-8401 | TEL | 200009 | K84849 | |
| 77 | Etch | DRY ETCHER nit | TE-8401 | TEL | 200209 | K84869 | |
| 78 | Etch | DRY ETCHER nit | TE-8401 | TEL | 200209 | K84874 | |
| 79 | Etch | SILICON OXIDE ETCHER | TE-8500 | TEL | 199409 | K85159 | |
| 80 | Etch | SILICON OXIDE ETCHER | TE-8500 | TEL | 199409 | K85158 | |
| 81 | Etch | W ETCHBACK ETCHER | TE-8600 | TEL | 199604 | K86552 | |
| 82 | Implant | Ion Implanter | NV-GSD-3-180 | SEN | 20000430 | F87 | |
| 83 | implant | Ion Implanter | XR80 | AMAT | 199806 | M367 | |
| 84 | implant | ION IMPLANTATION | E220 | Varian | 199408 | 037100 | |
| 87 | Litho | Stepper | FPA-3000i4 | Canon | 19960131 | 510536 | |
| 88 | Litho | Stepper | FPA-3000i4 | Canon | 19960930 | 510534 | |
| 89 | Litho | Coater/Developer | CT-MK8 | TEL | 19960228 | MD-815512 | |
| 90 | Litho | Coater/Developer | CT-MK8 | TEL | 19960228 | MD-815511 | |
| 91 | Litho | Coater/Developer | CT-MK8 | TEL | 19960930 | MD-825513 | |
| 92 | Litho | Coater/Developer | CT-MK8 | TEL | 19980430 | MD-8171202 | |
| 93 | Litho | Stepper | FPA-3000EX5 | Canon | 19990630 | 9025032EX5 | |
| 94 | Litho | Stepper | FPA-3000EX5 | Canon | 19991231 | 9085062EX5 | |
| 95 | Litho | Stepper | FPA-3000EX5 | Canon | 20000430 | 9115074 | |
| 99 | Litho | Stepper | FPA-3000iW | Canon | 19960930 | 510140 | |
| 100 | Litho | STEPPER | FPA-3000iW | Canon | 200010 | 0063-10iw | |
| 101 | Litho | STEPPER | FPA-2500I3 | Canon | 199408 | 404570i3 | |
| 102 | Litho | STEPPER | FPA-2500I3 | Canon | 199408 | 404569i3 | |
| 103 | Litho | Coater/Developer-DUV | CT-ACT8 | TEL | 20010331 | MD-9201799 | |
| 104 | Litho | Coater/Developer-DUV | ACT8 (LD nozzle) | TEL | 20060630 | 9163116 | |
| 105 | Litho | Coater/Developer-DUV | CT-ACT8 | TEL | 19990630 | MD-9190497 | Config |
| 106 | Litho | Coater/Developer-DUV | CT-ACT8 | TEL | 19991231 | MD-9190702 | |
| 107 | Litho | Coater/Developer | CT MARK-8 | TEL | 19950630 | 815315 | |
| 108 | Litho | Coater/Developer | CT MARK-8 | TEL | 19950731 | 815321 | |
| 109 | Litho | Coater/Developer | CT-MK8(10000CWD-FPA) | TEL | 19970930 | MD-8171112 | |
| 110 | Litho | Coater/Developer | CT-MK8(10000CWD-FPA) | TEL | 19971231 | MD-8171175 | |
| 367 | Litho | Coater/Developer | CT-MK5 | TEL | 19900331 | MD-529029 | |
| 111 | Litho | Coater | CT-MK7 | TEL | 19960131 | MD-715692 | |
| 112 | Litho | Coater | CT-MK7 | TEL | 19970930 | MD-7171115 | |
| 113 | Litho | Coater | SC-W80A-AVG | DNS | 19950630 | 54700-2808 | |
| 114 | Litho | Coater | SC-W80A-AV | DNS | 19950731 | 54700-2811 | |
| 115 | Litho | Coater/Developer | ACT-8(Iw) | TEL | 200007 | MD-9101192 | |
| 116 | Litho | Coater/Developer | CLEANTRACK-ACT8(iW) | TEL | 200010 | MD-9101430 | |
| 117 | Litho | Coater/Developer | CT ACT-8 | TEL | 200006 | MD-9101147 | |
| 119 | Litho | COATER/DEVELOPER | CT MK-8 | TEL | 199408 | MD-814156 | |
| 120 | Litho | COATER/DEVELOPER | CT MK-8 | TEL | 199507 | 814168 | |
| 121 | Litho | COATER/DEVELOPER | CT MK-8(iW) | TEL | 199812 | 8281711 | Config |
| 122 | Litho | COATER/DEVELOPER(iW) | CT MK-8 | TEL | 199803 | MD8271415 | Config |
| 123 | Litho | Photostabilizer System | FUSION-200PCU | Axcelis | 19950731 | PU5A126J | |
| 124 | Litho | UV Cure | UMA-1002-HC93FW | Ushio | 19960228 | 9511003 | |
| 125 | Metals | LPCVD | MB2-730 | TEL | 20000930 | MCJ-181 | |
| 126 | Metals | LPCVD | MB2-730 | TEL | 200008 | MCJ-183 | |
| 127 | Metals | LPCVD | MB2-730(DCS) | TEL | 200012 | MCJ-190 | |
| 128 | Metals | LPCVD | MB2-730(W) | TEL | 20001130 | MCJ-185 | Config |
| 129 | Metals | Sputter | MB2-830(TI/C) | TEL | 19950630 | MPJ-09 | Config |
| 130 | Metals | Sputter | MB2-830(TI/TIN) | TEL | 19970930 | MPJ-023 | Config |
| 131 | Metals | Sputter | MB2-830(TIN) | TEL | 19960228 | MPJ-016 | Config |
| 132 | Metals | Sputter | ENDURA | AMAT | 19950131 | 3210 | |
| 133 | Metals | Sputter | ENDURA | AMAT | 19960228 | 3543 | |
| 134 | Metals | Sputter | ENDURA | AMAT | 19960930 | 3728 | |
| 135 | Metals | Sputter | ENDURA | AMAT | 19970131 | 3770 | |
| 136 | Metals | Sputter | ENDURA | AMAT | 19970731 | P018 | |
| 137 | Metals | Sputter | ENDURA-HP | AMAT | 19950630 | E-5506 | |
| 138 | Metals | Sputter | ENDURA-5500 | AMAT | 20000331 | P839 | Config |
| 139 | Metals | Sputter | ENDURA-5500 | AMAT | 20000531 | P942 | |
| 140 | Metals | Sputter | ENDURA-5500 | AMAT | 20000831 | P863 | |
| 142 | Metals | Sputter | ENDURAHPPVDSYSTEM | AMAT | 20010131 | 307737 | |
| 144 | Metro | CD-SEM | JSM-6340F | JEOL | 19971231 | SM168013-0048 | |
| 145 | Metro | SEM | JSM-6340F | JEOL | 199710 | SM168010-35 | |
| 146 | Metro | SEM | JWS-7500E | JEOL | 19950831 | WS175018-41 | |
| 148 | Metro | FESEM | S-4500 | Hitachi | 19950731 | 7924-01 | |
| 150 | Metro | SEM | S-8820 | Hitachi | 199602 | 8327-108820 | |
| 152 | Metro | CD-SEM | S-8820S | Hitachi | 19960228 | 2346135 | |
| 153 | Metro | CD-SEM | S-8840 | Hitachi | 19971231 | 2356790 | |
| 154 | Metro | CD-SEM | S-8840 | Hitachi | 19970831 | 2355237 | |
| 155 | Metro | SEM | S-8840 | Hitachi | 199804 | 910402 | |
| 156 | Metro | SEM | S-8840 | Hitachi | 199803 | 910409 | |
| 157 | Metro | CD-SEM | S-9200 | Hitachi | 20000430 | 2854066 | |
| 159 | Metro | Review SEM | SEMVISION_CX | AMAT | 20061231 | W-863 | |
| 160 | Metro | FIB | SMI8800 | SII | 19950331 | ||
| 162 | Metro | High Resolution Surface Profiler | HRP-240 | KLA-Tencor | 20060531 | 306157686 | |
| 163 | Metro | Overlay measurement | KLA-5200XP | KLA-Tencor | 19970930 | 2048 | |
| 164 | Metro | Wafer Inspecsion | OPTISTATION ? | Nikon | 20061231 | ||
| 165 | Metro | Wafer Inspecsion | OPTISTATION ? | Nikon | 20061231 | ||
| 166 | Metro | Wafer Inspecsion | AL-2100 | Olympus | 20061231 | 108047 | |
| 167 | Metro | Resistivity mapping system | OMNIMAP RS35C | KLA-Tencor | 19950630 | 950216RS35CA | |
| 168 | Metro | Resistivity mapping system | RS35C | KLA-Tencor | 19960131 | 951013 | |
| 169 | Metro | Resistivity mapping system | RS35C | KLA-Tencor | 19960930 | 960124 | |
| 170 | Metro | Non pattern wafer inspection | SFS6420 | KLA-Tencor | 19960228 | 0196-208 | |
| 171 | Metro | Non pattern wafer inspection | SFS6420 | KLA-Tencor | 19960930 | 0196-206 | |
| 173 | Metro | Review Station | INS-2000(for SFS-AIT) | Leica | 19960930 | - | |
| 174 | Metro | Thin Film Measurement | UV-1050 | KLA-Tencor | 19960131 | 951072 | |
| 175 | Metro | Thin Film Measurement | UV-1050 | KLA-Tencor | 19970331 | 960174 | |
| 176 | Metro | Thin Film Measurement | NANOSPEC 8000XSE-NT | Nanometrics | 20000430 | 8000X-0100-0178 | |
| 177 | Metro | Thin Film Measurement | NANOSPEC 8000XSE-NT | Nanometrics | 20001130 | 001 | |
| 178 | Metro | Thin Film Measurement | NANOSPEC 8000XSE-NT | Nanometrics | 20011031 | L8000X-03010228 | |
| 179 | Metro | X-Ray Fluor Analysis System | 3640 | Rigaku | 20061231 | YR41004 | Config Spec |
| 180 | Metro | Surface Photo Voltage Tester | SPV-1020 | SDI | 20021031 | 94-060069 | |
| 181 | Metro | Microscope | MX50A-8/AL110 | Olympus | 20000430 | E906033 | |
| 182 | Metro | Microscope | MX50A-8/AL110 | Olympus | 20000430 | E906032 | |
| 183 | Metro | Microscope | MX50A-8/AL110 | Olympus | 20000430 | E903022 | |
| 184 | Metro | Microscope | MX50A-8/AL110 | Olympus | 20000430 | E906030 | |
| 185 | Metro | Microscope | MX50A-8/AL110 | Olympus | 20000430 | E906029 | |
| 186 | Metro | Microscope | VMZ | Nikon | 19890220 | 261726 | |
| 187 | Metro | Microscope | X6PDER-UBD | Nikon | 19900331 | - | |
| 188 | Metro | Microscope | X6PDER-UBD | Nikon | 19900331 | - | |
| 189 | Metro | Microscope | X6PDUW-UBD | Nikon | 19900331 | - | |
| 190 | Metro | Microscope | X6PDUW-UBD | Nikon | 19900331 | - | |
| 191 | Metro | Microscope | Ryokosha | 20061231 | |||
| 192 | Metro | WAFER INSPECTION | KLA-2112 | KLA-Tencor | 199603 | 696 | |
| 193 | Metro | WAFER INSPECTION | KLA-2115 | KLA-Tencor | 199710 | 1016 | |
| 194 | Metro | WAFER INSPECTION | KLA-2115 | KLA-Tencor | 199710 | 971 | |
| 198 | Metro | OVERLAY MEASUREMENT | KLA-5100 | KLA-Tencor | 199607 | 1234 | |
| 199 | Metro | Overlay measurement | KLA-5100 | KLA-Tencor | 19960228 | 1217 | |
| 200 | Metro | Overlay measurement | KLA5200 | KLA-Tencor | 199710 | 2074 | |
| 201 | Metro | Overlay measurement | KLA-5200XP | KLA-Tencor | 20000831 | 2168 | |
| 202 | Metro | Overlay measurement | KLA-5200XP | KLA-Tencor | 20060228 | 2259R | |
| 203 | Metro | Review Station | INS-2000 | Leica | 19961130 | KLA-2 | |
| 204 | Metro | Review Station | INS-2000(for P-KLA2135) | Leica | 19971231 | 561INS-0046 | |
| 205 | Metro | Review Station | INS-2000(for SFS-7700) | Leica | 19971130 | 561INS-0049 | |
| 206 | Metro | Review Station | MIS-200 | Leica | 19960630 | 55MIS-0027 | |
| 207 | Metro | Non pattern wafer inspection | WM2500 | Topcon | 20061231 | 1010038 | |
| 208 | Metro | Wafer Inspecsion | IS2600 | Hitachi | 20061231 | 12675 | |
| 209 | Metro | Non pattern wafer inspection | SFS6420 | KLA-Tencor | 19970930 | 0497-408 | |
| 210 | Metro | Surface Analyzer | SURFSCAN 6420 | KLA-Tencor | 19950930 | 0595-112 | |
| 211 | Metro | Surface Analyzer | SURFSCAN 7600 | KLA-Tencor | 19950531 | 0295-494 | |
| 212 | Metro | Ellipsometer | LM-115AF-WH | Gaertner Scientific | 19950831 | 1628-AK | |
| 213 | Metro | Ellipsometer | FE-4 | Rudolph | 199505 | 10616 | |
| 214 | Metro | Ellipsometer | FE-7 | Rudolph | 19971031 | 10813 | |
| 215 | Metro | Ellipsometer | FE-7 | Rudolph | 19971231 | 10847 | |
| 216 | Metro | Thin Film Measurement | FT-750 | KLA-Tencor | 19960930 | 960153 | |
| 217 | Metro | Thin Film Measurement | FT-750 | KLA-Tencor | 19960930 | 960154 | |
| 218 | Metro | Thin Film Measurement | FT-750 | KLA-Tencor | 19961130 | 960652 | |
| 219 | Metro | Thin Film Measurement | UV-1280SE | KLA-Tencor | 20001031 | 293 | |
| 220 | Metro | Resistivity mapping system | RS75TC | KLA-Tencor | 19970930 | 970417 | |
| 221 | Metro | SHEET,RESIST | M-GAGE300 | KLA-Tencor | 199408 | 0294-0715 | |
| 222 | Metro | Thin Film Measurement | M-GAGE300 | KLA-Tencor | 19960131 | 0895-0760 | |
| 223 | Metro | Resistivity mapping system | RESMAP468 | CDE | 20061231 | - | |
| 225 | Metro | Surface Profiler | P-2 | KLA-Tencor | 19960131 | 9950431 | |
| 226 | Metro | Surface Profiler | P-2H | KLA-Tencor | 19950531 | 02950387 | |
| 227 | Metro | Surface Profiler | P-11 | KLA-Tencor | 19970930 | 0497-0191 | |
| 228 | Metro | X-Ray Fluor Analysis System | 3630 | Rigaku | 19960331 | SR42011 | |
| 229 | Metro | X-Ray Fluor Analysis System | 3630 | Rigaku | 19971231 | TR42023 | |
| 230 | Metro | X-RAY FLUORE | S3630 | Rigaku | 2W0465 | ||
| 342 | Metro | SPV3030 | SPV3030 | SDI | 200204 | 97-050126 | |
| 232 | RTP | Lamp Annealer | LA-820 | DNS | 20001231 | 60710-5125 | |
| 233 | RTP | Rapid Thermal Process | HEAT PULSE-8108 | AG Associates | 19951130 | - | |
| 234 | RTP | CVD | CENTURA RTP | AMAT | 200010 | 302614 | |
| 235 | RTP | RTA | LA-W815-AV2.5 | DNS | 199408 | 53710-4028 | |
| 236 | Strip | Photoresist Stripper | WSST(Dual Chamber) | Semitool | 20010131 | F170067 | |
| 237 | Strip | Photoresist Stripper | WSST(Dual Chamber) | Semitool | 20000430 | F1S3230 | |
| 238 | Strip | Photoresist Stripper | WSST(Dual Chamber) | Semitool | 19961231 | F76530 | |
| 239 | Strip | Photoresist Stripper | WSST(Dual Chamber) | Semitool | 19971231 | F105579 | |
| 240 | Strip | Photoresist Stripper | WSST | Semitool | 19950630 | F60715 | |
| 241 | Test | Vacuum Oven | LCV-242P | Tabai-Espec | 19900228 | - | |
| 242 | Test | VLSI Tester | T3320-F | ADVANTEST | 19900331 | ||
| 243 | Test | VLSI Tester | T3382 | ADVANTEST | 19920430 | ||
| 245 | Test | Tester | T5363P | ADVANTEST | 19930630 | F13 | |
| 246 | Test | Parametric Tester | 4072B | Agilent Technology | 20071031 | ||
| 247 | Test | DC Parametric Tester | S425 | TEL | 19960531 | QMO-2770 | |
| 248 | Test | Prober | P-8 | TEL | 19980331 | - | |
| 249 | Test | FullAuto Prober | P-8 | TEL | 19951031 | ||
| 250 | Test | FullAuto Prober | P-8 | TEL | 19960131 | ||
| 251 | Test | FullAuto Prober | P-8 | TEL | 19961130 | ||
| 252 | Test | FullAuto Prober | P-8XL | TEL | 19990331 | ||
| 253 | Test | FullAuto Prober | A-PM-90A | TSK | 19970131 | ||
| 254 | Test | FullAuto Prober | UF200 | TSK | 20000131 | ||
| 255 | Test | FullAuto Prober | UF200 | TSK | 20061231 | ||
| 256 | Test | Prober | UF200 | TSK | 19990131 | - | |
| 257 | Test | Parametric Tester | 4062UX | HP | 19920331 | 2848J00269 | |
| 258 | Test | Parametric Tester | HP4062UX | HP | 19990430 | 2848J00921 | |
| 259 | Test | Parametric Tester | HP4062UX | HP | 19950331 | 2848J00540 | |
| 260 | Test | Parametric Tester | 4062F | HP | 200304 | JP10B00135 | |
| 261 | Test | Parametric Tester | HP4071A | HP | 200003 | JP20D00413 | |
| 262 | Test | Parametric Tester | HP4071A | HP | 200004 | JP20D00456 | |
| 263 | Test | Parametric Tester | HP4071A | HP | 199711 | JP10D00190 | |
| 264 | Test | Parametric Tester | HP4071A | HP | 199804 | JP10D00212 | |
| 265 | Test | Parametric Tester | HP4071A | HP | 199804 | JP10D00234 | |
| 267 | Test | Parametric Tester | HP4155A | HP | 199407 | JP10A00214 | |
| 268 | Test | Parametric Tester | HP4155A | HP | 199711 | JP10A01007 | |
| 270 | Test | Parametric Tester | S-900 | Keithley | 199602 | QMO 2641 | |
| 271 | Test | Parametric Tester | S-900 | Keithley | 199602 | QMO 2640 | |
| 274 | Test | DC Parametric Tester | S425 | TEL | 19950228 | QMO-2583 | |
| 275 | Test | LSI Tester | 9495 | HP | 19970131 | ||
| 276 | Test | Tester | WL832B | Shibasoku | 19880930 | ||
| 277 | Test | LCD Tester | TS702 | Yokogawa | 19970331 | ||
| 278 | Test | Tester | T3316 | ADVANTEST | 19950731 | F06 | |
| 279 | Test | Tester | T3316 | ADVANTEST | 19950731 | F05 | |
| 280 | Test | Tester | T3316 | ADVANTEST | 19950731 |